References

RESEARCH ON THE DETERMINATION OF SILICON CARBIDE EPITAXIAL LAYER THICKNESS BASED ON INFRARED INTERFERENCE PRINCIPLE AND NON-LINEAR LEAST SQUARES METHOD


[1] Guolei Gu, Research on Online Measurement System of Thin Film Thickness Based on Infrared Technology, Heilongjiang: Harbin Institute of Technology, 2016.

[2] Ruixia Miao, Yuming Zhang, Yimen Zhang and Xiaoyan Tang, A Method for Nondestructive Measurement of 4H-SiC Epitaxial Layer Thickness Using Stacking Faults, Xi'an: Xidian University, 2010.

[3] Huaqiao Zhao. Research on Key Issues of Full-Spectrum Solar Rectenna, Wuhan: Wuhan University, 2020.

[4] Jun Zhu, Wenqing Liu, Jianguo Liu, Yihuai Lu, Minguang Gao and Liang Xu, Quantitative Analysis of Gases by Fourier Transform Infrared Spectroscopy, Chinese Journal of Scientific Instrument 28(1) (2007), 80-84.

[5] Jiakui Tang, Yong Xue, Tong Yu, Yanning Guan, Guoyin Cai and Yincui Hu, MODIS Land Aerosol Remote Sensing Retrieval: Synergistic Retrieval Algorithm Using TERRA and AQUA MODIS Data, Science in China (Series D: Earth Sciences) 35(05) (2005), 474-481.

[6] Weiwei Feng, Lihuang Lin and Ligang Chen, Study on Polarization Interference Spectrum of Quartz Waveplate, Acta Optica Sinica 27(6) (2007), 1044-1048.

[7] Yandong Zhang, Iterative Least Squares Method for Linear-Nonlinear Model Inversion, Wuhan: Wuhan University, 2018.

[8] Jinrui Yang. Porous Silicon Ethanol Sensor Based on Fabry-Perot Interference Effect, Chongqing: Chongqing University, 2009.