References

REDUCED CONTACT RESISTANCE TI/AL OHMIC CONTACTS TO VERTICALLY ALIGNED ZNO NANOROD


[1] D. M. Bagnall, Y. F. Chen, Z. Zhu, T. Yao, S. Koyama, M. Y. Shen and T. Goto, Optically pumped lasing of ZnO at room temperature, Appl. Phys. Lett. 70 (1997), 2230-2233.

[2] L. J. Brillson and Y. Lu, ZnO Schottky barriers and ohmic contacts, J. Appl. Phys. 109 (2011), 121301.

[3] L. J. Brillson and Y. C. Lu, ZnO Schottky barriers and ohmic contacts, J. Appl. Phys. 109 (2011), 121301-121334.

[4] L. S. Chuah, Z. Hassan and H. Abu Hassan, Preferential orientation growth of AlN thin films on Si(111) substrates by plasma-assisted molecular beam epitaxy, Surface Review and Letters 16(6) (2009), 925-928.

[5] L. S. Chuah, Z. Hassan and S. G. Teo, Effect of thermal annealing on the Ir/Ag contact to p-GaN, Journal of Non-Crystalline Solids 356 (2010), 1863-1866.

[6] M. A. Haase, J. Qui, J. M. De Puydt and H. Cheng, Appl. Phys. Lett. 59 (1991), 1272.

[7] Z. Hassan, Y. C. Lee, F. K. Yam, Z. J. Yap, N. Zainal, H. Abu Hassan and K. Ibrahim, Phys. Stat. Sol (c) 1 (2004), 2528-2532.

[8] Z. Hassan, F. K. Yam, Z. J. Yap, A. Abdul Aziz and K. Ibrahim, Materials Science Forum 480 (2005), 525-530.

[9] K. Ip, Y. W. Heo, K. H. Baik, D. P. Norton, S. J. Pearton and F. Ren, Appl. Phys. Lett. 84 (2004), 544.

[10] K. Ip, Y. W. Heo, K. H. Baik, D. P. Norton, S. J. Pearton and F. Ren, Appl. Phys. Lett. 84 (2004), 544-546.

[11] K. Ip, Y. W. Heo, D. P. Norton, S. J. Pearton, J. R. LaRoche and F. Ren, Appl. Phys. Lett. 85 (2004), 1169.

[12] K. Ip, G. T. Thaler, H. Yang, S. Y. Han, Y. Li, D. P. Norton, S. J. Pearton, S. Jang and F. Ren, J. Cryst. Growth 287 (2006), 149.

[13] S. C. Jain, M. Willander, J. Narayan and R. Van Overstraeten, J. Appl. Phys. 87 (2000), 965.

[14] H. Kim, S. Han, T. Seong and W. Choi, J. Electrochem. Soc. 148 (2001), G114.

[15] H.-K. Kim, S.-H. Han, W. K. Choi and T.-Y. Seong, Appl. Phys. Lett. 77 (2000), 1647.

[16] H.-K. Kim, T.-Y. Seong, K.-K. Kim, S.-J. Park, Y. S. Yoon and I. Adesida, Jpn. J. Appl. Phys., Part 1 43 (2004), 976.

[17] H.-K. Kim, J. W. Bae, K. K. Kim, S. J. Park, T. Y. Seong and I. Adesida, Thin Solid Films 447/448 (2004), 90-94.

[18] H.-K. Kim and J. M. Lee, Superlat. Microstruct. 42 (2007), 255-258.

[19] J. H. Kim, J. Y. Moon, H. S. Lee, W. S. Han, H. K. Cho, J. Y. Lee and H. S. Kim, Mat. Sci. Eng. B 165 (2008), 77.

[20] J. H. Kim, J. Y. Moon, H. S. Lee, W. S. Han, H. K. Cho, J. Y. Lee and H. S. Kim, Al/Au Ohmic contact to n-ZnO by dc sputtering, Materials Science and Engineering: B 165 (2009), 77-79.

[21] S. Kim, H. Jang, J. Kim, C. Jeon, W. Park, G. Yi and J. Lee, J. Electron. Mater. 31 (2002), 868.

[22] S. Kim, S. Jeong, D. Hwang, S. Park and T. Seong, Zn/Au Ohmic contacts on n-type ZnO layers for light-emitting devices, Electrochemical and Solid-State Letters 8 (2005), G198-G200.

[23] S.-H. Kim, K.-K. Kim, S.-J. Park and T.-Y. Seong, J. Electrochem. Soc. 152 (2005), G169.

[24] S. Y. Kim, H. W. Jang, J. K. Kim, C. M. Jeon, W. I. Park, G. C. Yi and J. L. Lee, Low-resistance Ti/Al ohmic contact on undoped ZnO, Journal of Electronic Materials 31 (2002), 868-871.

[25] O. Kordina, J. P. Bergman, A. Henry, E. Janzen, S. Savage, J. Andre, L. P. Ramberg, U. Lindefelt, W. Hermansson and K. Bergman, Appl. Phys. Lett. 67 (1995), 1561.

[26] J. Lee, K. Kim, S. Park and W. Choi, Appl. Phys. Lett. 78 (2001), 3842.

[27] Y. F. Lu, Z. Z. Ye, Y. J. Zheng, L. P. Zhu and B. H. Zhao, Electrochem. Solid-State Lett. 11 (2008), H185.

[28] S. J. Pearton, D. P. Norton, K. Ip, Y. W. Heo and T. Steiner, Prog. Mater. Sci. 50 (2005), 293.

[29] G. K. Reeves and H. B. Harrison, Elektron Device Letters 3 (1982), 111-113.

[30] S. Ruvimov, Z. Kiliental-Weber, J. Washburn, K. J. Duxstad, E. E. Haller, Z.-F. Fan, S. N. Mohammad, W. Kim, A. E. Botchkarev and H. Morkoc, Appl. Phys. Lett. 69 (1996), 1556.

[31] J. Salfi, U. Philipose, C. F. de Sousa, S. Aouba and H. E. Ruda, Appl. Phys. Lett. 89 (2006), 261112.

[32] H. Sheng, N. W. Emanetoglu, S. Muthukumar, S. Feng and Y. Lu, J. Electron. Mater. 31 (2002), 811-814.

[33] H. Sheng, S. Muthukumar, N. Emanetoglu, B. Yakshinskiy, S. Feng and Y. Lu, J. Electron. Mater. 32 (2003), 935.

[34] H. S. Yang, D. P. Norton, S. J. Pearton and F. Ren, Appl. Phys. Lett. 87 (2005), 212106.

[35] H. Zhu, C. X. Shan, B. Yao, B. H. Li, J. Y. Zhang, Z. Z. Zhang, D. X. Zhao, D. Z. Shen, X. W. Fan, Y. M. Lu and Z. K. Tang, Ultralow-threshold laser realized in zinc oxide, Advanced Materials 21 (2009), 1613-1617.

[36] F. Zhuge, L. P. Zhu, Z. Z. Ye, D. W. Ma, J. G. Lu, J. Y. Huang, F. Z. Wang, Z. G. Ji and S. B. Zhang, Appl. Phys. Lett. 87 (2005), 092103.