Volume no :5, Issue no: 2, April (2012)

STRUCTURAL, TRANSPORT PROPERTIES AND DIFFUSION STUDY OF OXYGEN ATOMS FOR TYPE HEXAFERRITE DOPED WITH

Author's: M. EL-SAADAWY
Pages: [135] - [151]
Received Date: February 25, 2012
Submitted by:

Abstract

Series of polycrystalline samples of were prepared by usual ceramic methods, where x = 0.0, 0.4, 0.6, 0.8, 1.0, 1.2, 1.4, and 1.6. X-ray analysis were obtained at room temperature by using with confirms the presence of W-type hexaferrite phase structure. The dc electrical conductivity and the dielectric constant were studied. The experimental results showed that dc resistivity, dielectric constant, Curie temperature, and activation energies for electrical conduction increase as Cu ion substitution increases. The dc electrical conductivity increases as temperature increases. The oxygen diffusion in the samples at annealing temperature of for 1 min, was studied. The diffusion coefficient was calculated by using the equation It was found that the oxygen diffusion is characterized by a relatively small activation energy (0.215eV) and low pre-exponential factors The substitution of Cu ions decreases the diffusion coefficient up to x = 1.2 and then increase it.

Keywords

X-ray analysis, electrical properties, charge carrier concentration, diffusion coefficient, hexagonal ferrite.